With 50 billion transistors on a single chip, researchers strive for more precise measurements and imaging techniques, and for new ways of taking and predicting those measurements.
Current Research:
- Wide bandgap and ultra-wide bandgap semiconductor characterization and epitaxy for optoelectronics and power devices
- Growth and physical properties of ultrathin and thin films, and nanostructures. Inventing techniques using electron diffraction for texture analysis and reciprocal space mapping of epitaxial thin films and nanostructures
- Coherent X-ray scattering and imaging neutron scattering; light matter interactions; AI implementations
- Development of novel processes for device fabrication, non-contact lifetime measurement
